Items where Author is "Edwards, Christopher"

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Article

Zhang, Kaiqiang and Hatano, Toshiaki and Tien, Thang and Herrmann, Guido and Edwards, Christopher and Burgess, Stuart C and Miles, Mervyn (2015) An adaptive non-raster scanning method in atomic force microscopy for simple sample shapes. Measurement Science and Technology, 26 (3). 035401. ISSN 0957-0233

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